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Interfacial energy-dispersive spectroscopy profile X-ray resolution measurements in variable pressure SEM

Abdelhalim Zoukel1, Lahcen Khouchaf1, Jean Di Martino2

  • 11Univ-Lille Nord de France,Ecole des Mines de Douai,941 rue Charles Bourseul,BP 10838,59500 Douai,France.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|June 25, 2014
PubMed

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