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Evaluating angular ion current density for atomically defined nanotips.

Radovan Urban1, Robert A Wolkow1, Jason L Pitters2

  • 11Department of Physics,University of Alberta,Edmonton,AB,Canada T6G 2G9.

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Summary
This summary is machine-generated.

Characterizing angular current density from gas field ion sources is challenging due to averaged measurements. This study proposes methods for accurate determination by knowing beam diameter and total ion current.

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Area of Science:

  • Atomic and Surface Physics
  • Ion Beam Technology
  • Materials Science

Background:

  • Atomically defined gas field ion sources emit ion beams.
  • Characterizing the angular current density is crucial for source performance evaluation.

Purpose of the Study:

  • To investigate methods for accurately characterizing angular current density from single-apex field ion sources.
  • To address limitations of traditional measurement techniques using fixed apertures.

Main Methods:

  • Modeling the ion beam as a two-dimensional Gaussian profile.
  • Analyzing the effects of fixed apertures on current density measurements.
  • Proposing a method for consistent determination of angular current density and voltage normalization.

Main Results:

  • The ion beam exhibits a Gaussian profile.
  • Fixed apertures lead to averaged angular current density measurements, complicating data comparison.
  • Accurate measurements require knowledge of beam diameter and total ion current.

Conclusions:

  • Traditional fixed aperture methods provide averaged data, hindering direct comparison and voltage normalization.
  • Beam profile can be extracted from measurements at varying voltages or aperture sizes when direct imaging is not feasible.
  • The proposed method enables consistent angular current density determination and voltage normalization.