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Controlling the Er content of porous silicon using the doping current intensity

Guido Mula1, Lucy Loddo1, Elisa Pinna1

  • 1Dipartimento di Fisica, Cittadella Universitaria di Monserrato, Università degli Studi di Cagliari, S.P. 8 km 0.7, Monserrato, Cagliari 09042, Italy.

Nanoscale Research Letters
|July 16, 2014
PubMed

Keywords:
Electrochemical impedance spectroscopyEr dopingPorous SiliconReflectivityScanning electron microscopy

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