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Local frequency and envelope estimation by Teager-Kaiser energy operators in white-light scanning interferometry
Optics Express
|August 5, 2014
Summary
A novel surface extraction method for white light scanning interferometry (WLSI) utilizes the Teager-Kaiser energy operator. This technique offers robust and effective surface extraction, outperforming existing methods even with noise.
Area of Science:
- Optics and Photonics
- Signal Processing
- Metrology
Background:
- White light scanning interferometry (WLSI) is a key technique for high-resolution surface profiling.
- Accurate surface extraction is crucial for metrology applications but can be challenging due to noise and signal variations.
- Existing methods like peak fringe scanning and phase shifting algorithms have limitations in complex scenarios.
Purpose of the Study:
- To introduce a new, robust method for surface extraction in WLSI.
- To leverage the Teager-Kaiser energy operator for enhanced signal analysis in interferometry.
- To demonstrate the superiority of the proposed method over conventional techniques.
Main Methods:
- Development of a surface extraction scheme based on the Teager-Kaiser energy operator and its extended versions.
- Utilizing the operator's ability to extract local instantaneous envelope and frequency from AM-FM signals.
- Implementing an iterative phase re-estimation with a novel TK cross-energy operator-based correlation technique.
Main Results:
- The proposed method demonstrates substantially effective surface extraction compared to peak fringe scanning, five-step phase shifting, and continuous wavelet transform methods.
- Experimental results confirm the method's robustness against noise.
- The technique also shows resilience to fluctuations in the carrier frequency.
Conclusions:
- The Teager-Kaiser energy operator-based method provides a significant advancement in WLSI surface extraction.
- This approach offers improved accuracy and reliability, particularly in the presence of noise and signal instability.
- The method presents a promising alternative for high-precision surface metrology.
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