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Internal resistor of multi-functional tunnel barrier for selectivity and switching uniformity in resistive random

Sangheon Lee1, Jiyong Woo1, Daeseok Lee1

  • 1Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Republic of Korea.

Nanoscale Research Letters
|August 13, 2014
PubMed

Keywords:
ReRAMReliabilitySelectivity

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