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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Lateral MoS2 p-n junction formed by chemical doping for use in high-performance optoelectronics
Min Sup Choi1, Deshun Qu, Daeyeong Lee
1SKKU Advanced Institute of Nano-Technology (SAINT), ‡Center for Human Interface Nano Technology (HINT), and §Samsung-SKKU Graphene Center (SSGC), Sungkyunkwan University , 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 440-746, Korea .
Abstract:
This paper demonstrates a technique to form a lateral homogeneous 2D MoS2 p-n junction by partially stacking 2D h-BN as a mask to p-dope MoS2. The fabricated lateral MoS2 p-n junction with asymmetric electrodes of Pd and Cr/Au displayed a highly efficient photoresponse (maximum external quantum efficiency of ∼7000%, specific detectivity of ∼5 × 10(10) Jones, and light switching ratio of ∼10(3)) and ideal rectifying behavior. The enhanced photoresponse and generation of open-circuit voltage (VOC) and short-circuit current (ISC) were understood to originate from the formation of a p-n junction after chemical doping. Due to the high photoresponse at low VD and VG attributed to its built-in potential, our MoS2 p-n diode made progress toward the realization of low-power operating photodevices. Thus, this study suggests an effective way to form a lateral p-n junction by the h-BN hard masking technique and to improve the photoresponse of MoS2 by the chemical doping process.
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