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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

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High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

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Published on: March 22, 2024

Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.

Andrew Wang¹, Manish J Butte¹

¹Department of Pediatrics, Division of Immunology, Allergy and Rheumatology, Stanford University , Stanford, California 94305, USA.

Applied Physics Letters

|August 28, 2014

Summary

Researchers developed a new method using focused ion beam nanomanipulation to attach custom tips to atomic force microscopy (AFM) cantilevers. This technique enables advanced AFM applications by overcoming limitations of traditional fabrication methods.

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Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

Area of Science:

Materials Science
Nanotechnology
Biophysics

Background:

Conventional lithography limits tip geometry in scanning probe microscopy.
Tall tips with high aspect ratios are crucial for probing complex materials and biological structures with Atomic Force Microscopy (AFM).
Existing methods struggle to produce specialized tips needed for advanced AFM applications.

Purpose of the Study:

To present a novel technique for transferring pre-fabricated tips onto tipless AFM cantilevers.
To address the need for specialized tip geometries not achievable through conventional fabrication.
To demonstrate the utility of custom-designed tips for enhanced AFM measurements.

Main Methods:

Focused ion beam-assisted nanomanipulation for tip transfer.
Fabrication of tall (18 µm) cantilever tips.
Experimental characterization of tip performance and hydrodynamic effects.

Main Results:

Successfully transferred separately fabricated tips onto tipless AFM cantilevers.
Tall tips reduced squeeze-film damping, increasing the quality factor (Q) of the fundamental flexural mode.
Customized tall tips enabled improved elastic moduli measurements of T lymphocytes by accessing lower cellular regions.

Conclusions:

The focused ion beam-assisted nanomanipulation technique provides a versatile solution for attaching custom tips to AFM cantilevers.
This method overcomes limitations of conventional lithography, enabling advanced scanning probe microscopy applications.
The enhanced performance of custom tall tips facilitates more accurate measurements in complex biological and material science studies.