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Updated: Jul 4, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
High-Bandwidth AFM Probes for Imaging in Air and Fluid
Karthik Vijayraghavan1, Antonio A Gellineau1, Andrew Wang2
1Edward L. Ginzton Laboratories, Stanford University, Stanford, CA 94305 USA.
None:
Due to the high mechanical bandwidth of an integrated diffraction-grating-based force sensor, interdigitated AFM probes enable probing the nanomechanical properties of the sample by measuring fast varying tip-sample interaction forces while operating in tapping mode. To explain the mechanical frequency response obtained from finite-element analysis, we developed an analytical model that incorporates the higher order flexural modes of a cantilever. To enable flexibility necessary to use the probes in different imaging environments, a step is introduced into the batch fabrication where high-stress nitride is used. This step allows the probe to be used in various optical conditions such as different laser wavelengths (in the light-lever configuration), incident angles, and ambient refractive indices (such as air and water). We demonstrate that the probe can operate in both air and fluid and measure fast varying tip-sample interactions by imaging a sputtered gold film in both conditions.
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