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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Updated: Jul 4, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

High-Bandwidth AFM Probes for Imaging in Air and Fluid.

Karthik Vijayraghavan1, Antonio A Gellineau1, Andrew Wang2

  • 1Edward L. Ginzton Laboratories, Stanford University, Stanford, CA 94305 USA.

Journal of Microelectromechanical Systems : a Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems
|July 3, 2026
PubMed
Summary
This summary is machine-generated.

Interdigitated AFM probes with integrated diffraction gratings offer high mechanical bandwidth for measuring fast nanoscale forces. This enables precise nanomechanical property analysis in various environments, including air and fluid.

Keywords:
Atomic force microscopy (AFM)diffractionforce measurementgratingsimagingoptical interferometry

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Area of Science:

  • Nanotechnology
  • Materials Science
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanomechanical property analysis.
  • Existing AFM probes face limitations in mechanical bandwidth and environmental adaptability.
  • Tapping mode operation requires sensors capable of measuring fast-varying forces.

Purpose of the Study:

  • To develop novel interdigitated AFM probes with enhanced mechanical bandwidth.
  • To enable precise measurement of fast tip-sample interactions in diverse environments.
  • To create a flexible probe design for various optical and ambient conditions.

Main Methods:

  • Utilized integrated diffraction-grating-based force sensing.
  • Developed an analytical model incorporating higher-order flexural modes for frequency response analysis.
  • Incorporated a fabrication step using high-stress nitride for environmental flexibility.
  • Performed finite-element analysis to explain mechanical frequency response.

Main Results:

  • The developed probes exhibit high mechanical bandwidth, suitable for tapping mode operation.
  • The analytical model accurately explains the mechanical frequency response.
  • The probe design allows operation in various optical conditions (wavelengths, angles) and ambient media (air, water).
  • Successful imaging of a sputtered gold film in both air and fluid was demonstrated.

Conclusions:

  • Interdigitated AFM probes with integrated diffraction gratings significantly advance nanomechanical characterization.
  • The probes provide flexibility for operation in diverse imaging environments.
  • This technology enables reliable measurement of fast tip-sample interactions, crucial for understanding material properties.