Atomic Force Microscopy
Overview of Microscopy Techniques
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Updated: Jul 4, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Karthik Vijayraghavan1, Antonio A Gellineau1, Andrew Wang2
1Edward L. Ginzton Laboratories, Stanford University, Stanford, CA 94305 USA.
Interdigitated AFM probes with integrated diffraction gratings offer high mechanical bandwidth for measuring fast nanoscale forces. This enables precise nanomechanical property analysis in various environments, including air and fluid.
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