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An X-ray diffractometer using mirage diffraction

Tomoe Fukamachi1, Sukswat Jongsukswat1, Dongying Ju1

  • 1Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.

Journal of Applied Crystallography
|September 23, 2014
PubMed

Keywords:
X-ray difractometersdynamical theory of X-ray diffractioninterference fringesmirage diffractionmirage fringesmonochromators

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