The de Broglie Wavelength
Electrostatic Boundary Conditions in Dielectrics
Electrostatic Boundary Conditions
Electric Field of a Non Uniformly Charged Sphere
Imperfections in Crystal Structure: Stoichiometric Point Defects
Crystal Field Theory - Octahedral Complexes
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Apr 21, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
We developed a new computational method to accurately model electrons in strained semiconductor crystals. This approach efficiently calculates electronic properties for larger systems, offering a cost-effective alternative to existing techniques.
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: