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Updated: Apr 20, 2026

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
Published on: September 22, 2017
Fresnel zone plate stacking in the intermediate field for high efficiency focusing in the hard X-ray regime
Abstract:
Focusing efficiency of Fresnel zone plates (FZPs) for X-rays depends on zone height, while the achievable spatial resolution depends on the width of the finest zones. FZPs with optimal efficiency and sub-100-nm spatial resolution require high aspect ratio structures which are difficult to fabricate with current technology especially for the hard X-ray regime. A possible solution is to stack several zone plates. To increase the number of FZPs within one stack, we first demonstrate intermediate-field stacking and apply this method by stacks of up to five FZPs with adjusted diameters. Approaching the respective optimum zone height, we maximized efficiencies for high resolution focusing at three different energies, 10, 11.8, and 25 keV.
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