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Characterizing integration time and gray-level-related nonlinearities in a NMOS sensor

Javier Pacheco-Labrador, Alejandro Ferrero, M Pilar Martín

    Applied Optics
    |November 18, 2014
    PubMed
    Summary

    A nonlinearity effect in spectroradiometers was identified, caused by photoelectrons during sensor readout. A new, simple method effectively corrects this integration-time-related issue in negative-module metal-oxide semiconductor sensors.

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