Modeling of Pixelated Detector in SPECT Pinhole Reconstruction

Bing Feng1, Gengsheng L Zeng2

  • 1Siemens Molecular Imaging, Siemens Preclinical Solutions, Knoxville, TN 37932 USA (telephone: 865-218-2418).

IEEE Transactions on Nuclear Science
|January 10, 2015
PubMed