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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Direct bandgap transition in many-layer MoS2 by plasma-induced layer decoupling.
Rohan Dhall1, Mahesh R Neupane, Darshana Wickramaratne
1Ming Hsieh Department of Electrical Engineering, University of Southern California, Los Angeles, CA, 90089, USA; Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, 90089, USA.
Low-energy oxygen plasma treatment robustly enhances molybdenum disulfide (MoS2) photoluminescence by increasing interlayer separation. This method transitions MoS2 to a direct bandgap material, improving its optoelectronic properties for practical applications.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Molybdenum disulfide (MoS2) is a layered semiconductor with tunable optoelectronic properties.
- Many-layer MoS2 typically exhibits an indirect bandgap, limiting its efficiency in certain electronic and photonic devices.
- Engineering the band structure of MoS2 is crucial for advanced applications.
Purpose of the Study:
- To develop a robust method for enhancing the optoelectronic properties of many-layer MoS2.
- To investigate the effect of low-energy oxygen plasma treatment on MoS2.
- To achieve a direct bandgap in many-layer MoS2 without reducing its thickness.
Main Methods:
- Low-energy oxygen plasma treatment of mechanically exfoliated MoS2 flakes.
- Gas phase treatment using oxygen radicals generated in an N2-O2 plasma.
- Characterization using photoluminescence (PL) spectroscopy, atomic force microscopy (AFM), and Raman spectroscopy.
- Ab initio calculations to understand electronic structure changes.
Main Results:
- Oxygen plasma treatment enhanced MoS2 photoluminescence by up to 20 times.
- A blueshift in PL spectra and narrowed linewidth indicated a transition to a direct bandgap.
- AFM and Raman spectra showed an increase in flake thickness, suggesting increased interlayer separation.
- Ab initio calculations confirmed that increased interlayer separation decouples electronic states, enabling the bandgap transition.
- Enhanced PL signals were observed in 32 out of 35 treated MoS2 flakes (2-15 layers).
Conclusions:
- Low-energy oxygen plasma treatment is a robust and scalable method for engineering many-layer MoS2.
- The treatment effectively transitions MoS2 to a direct bandgap semiconductor by increasing interlayer separation.
- This approach provides a material with the direct bandgap of monolayer MoS2 while maintaining optical density, suitable for practical devices.
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