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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Dual conical conducting filament model in resistance switching TiO2 thin films

Kyung Min Kim1, Tae Hyung Park2, Cheol Seong Hwang2

  • 1Hewlett-Packard Laboratories, Hewlett-Packard Company, Palo Alto, California 94304, USA.

Scientific Reports
|January 20, 2015
PubMed

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