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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Highly-ordered silicon inverted nanocone arrays with broadband light antireflectance
Dong Zhang1, Weina Ren2, Zhichao Zhu2
1Department of Physics, Shanghai Normal University, No.100 Guilin Road, Shanghai, 200234 PR China.
Abstract:
In this work, highly-ordered silicon inverted nanocone arrays are fabricated by integration of nanosphere lithography with reactive ion etching (RIE) method. The optical characteristics of as-prepared Si inverted nanocone arrays are investigated both by experiments and simulations. It is found that the Si nanocone arrays present excellent broadband light antireflectance properties, which are attributed to the gradient in the effective refractive index of nanocones and enhanced light trapping owing to optical diffraction. The inverted Si nanocone arrays might find a variety of applications in solar cells and photodetectors.

