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Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices
Published on: December 7, 2017
Operating principles of in-plane silicon nanowires at simple step-edges
Mingkun Xu1, Zhaoguo Xue, Linwei Yu
1National Laboratory of Solid State Microstructures and School of Electronics Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, 210093, Nanjing, China. yulinwei@nju.edu.cn.
Abstract:
Growing silicon nanowires (SiNWs) into precise locations is a key enabling technology for SiNW-based device applications. This can be achieved via in-plane growth of SiNWs along a simple step-edge, where metal catalyst droplets absorb an amorphous Si matrix to produce c-SiNWs. However, a comprehensive understanding of this phenomenon is still lacking. We here establish an analytical model to address the driving force that dictates the growth dynamics under various droplet-step contact configurations, and to identify the key control parameters for effective guided growth. These new principles were verified against a series of experimental observations and proved to be powerful in designing a stable guided growth configuration. Furthermore, we propose and demonstrate a unique ability to achieve in situ capturing, guiding and release of the in-plane SiNWs along curved step-edges. We suggest that such a new understanding and results provide a fundamental basis and a practical guide for positioning and integrating self-assembled nanowires in a wide variety of material systems.

