Phase Contrast and Differential Interference Contrast Microscopy
Interference and Diffraction
X-ray Crystallography
Super-resolution Fluorescence Microscopy
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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Christoph Gammer1, V Burak Ozdol2, Christian H Liebscher3
1National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, United States; Department of Materials Science and Engineering, University of California, Berkeley, United States; Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Austria.
This study demonstrates two methods for reconstructing full diffraction information and images using virtual apertures in scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM). These techniques enable advanced imaging by overcoming physical limitations with software-generated apertures.
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