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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
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Light-Sharing Interface for dMiCE Detectors Using Sub-Surface Laser Engraving.

William C J Hunter1, Robert S Miyaoka1, Lawrence MacDonald1

  • 1Department of Radiology, University of Washington, Seattle, WA 98195 USA.

IEEE Transactions on Nuclear Science
|April 28, 2015
PubMed
Summary
This summary is machine-generated.

Sub-surface laser engraving (SSLE) offers a cost-effective method for depth of interaction (DOI) resolution in discrete crystals. This technique achieved preliminary DOI resolution of ~3.4-3.9 mm in dMiCE detectors, showing promise for improved imaging.

Keywords:
Depth of interactionPET detectorslaser etchingnuclear medicine detectorsradiation detectorsscintillators

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Area of Science:

  • Medical Physics
  • Detector Technology
  • Crystallography

Background:

  • The depth of interaction (DOI) resolution is crucial for enhancing imaging capabilities in detectors.
  • Previous methods for DOI encoding in discrete crystals, like dMiCE, faced challenges with cost and repeatability of interface treatments.
  • Sub-surface laser engraving (SSLE) presents a potential alternative for creating depth-dependent interfaces.

Purpose of the Study:

  • To investigate the feasibility of using sub-surface laser engraving (SSLE) for creating depth-dependent interfaces in dMiCE detectors.
  • To evaluate the preliminary depth of interaction (DOI) resolution and energy resolution achieved with SSLE-fabricated detectors.
  • To assess the potential for optimizing SSLE processes to improve DOI resolution.

Main Methods:

  • Utilized a first-generation SSLE system to engrave a partially reflective layer within LYSO crystal pairs.
  • Positioned engraved crystal boundaries between Silicon photomultiplier arrays to capture detector responses.
  • Acquired responses from 511-keV photon interactions at varying depths to determine DOI resolution using maximum-likelihood estimation.
  • Measured energy resolution alongside DOI resolution.

Main Results:

  • Achieved an average DOI resolution of 3.4 mm for front-sided readout and 3.9 mm for back-sided readout.
  • Obtained energy resolutions on the order of 10% despite using sub-optimal SSLE processing.
  • Demonstrated that SSLE can effectively create the necessary depth-dependent interface for DOI encoding.

Conclusions:

  • Sub-surface laser engraving (SSLE) is a viable technique for fabricating dMiCE detectors with DOI resolution capabilities.
  • Further optimization of the SSLE process and engraving patterns is expected to significantly improve DOI resolution.
  • SSLE offers a promising, potentially more cost-effective and repeatable, approach to DOI encoding in crystal detectors.