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Updated: Apr 13, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
Maximum a posteriori estimation of crystallographic phases in X-ray diffraction tomography
Doĝa Gürsoy1, Tekin Biçer2, Jonathan D Almer3
1X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL, USA dgursoy@aps.anl.gov.
A new maximum a posteriori method enhances X-ray diffraction tomography for materials science. This approach improves reconstructions, reducing artifacts and noise for faster, more efficient analysis.
Area of Science:
- Materials Science
- Crystallography
- Imaging Science
Background:
- X-ray diffraction tomography (XRD-T) is crucial for analyzing polycrystalline materials.
- Conventional methods face challenges with artifacts, noise, and undersampling.
Purpose of the Study:
- To develop a robust maximum a posteriori (MAP) approach for XRD-T.
- To improve the reconstruction of 3D crystallographic phase and orientation distributions.
Main Methods:
- The MAP approach maximizes a posteriori density, incorporating a Poisson log-likelihood.
- An a priori term enforces solution properties like smoothness and local continuity.
- The method was validated using experimental data from a porcine vertebra sample.
Main Results:
- Significant reduction in aliasing and streaking artifacts observed.
- Improved robustness to noise and undersampling compared to traditional methods.
- Demonstrated potential for reduced data acquisition times and enhanced beamtime efficiency.
Conclusions:
- The proposed MAP approach offers superior performance for XRD-T.
- This method advances the analysis of complex polycrystalline materials.
- It paves the way for more efficient and accurate materials characterization.
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