Maximum a posteriori estimation of crystallographic phases in X-ray diffraction tomography

Doĝa Gürsoy1, Tekin Biçer2, Jonathan D Almer3

  • 1X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL, USA dgursoy@aps.anl.gov.

Summary

A new maximum a posteriori method enhances X-ray diffraction tomography for materials science. This approach improves reconstructions, reducing artifacts and noise for faster, more efficient analysis.

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