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Updated: Apr 5, 2026

Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
Published on: July 26, 2016
Evanescent-Wave Cavity Ring-Down Ellipsometry
Michael A Everest1,2, Vassilis M Papadakis1, Katerina Stamataki1
1†Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.
Abstract:
We introduce the new technique of evanescent-wave cavity ring-down ellipsometry (EW-CRDE), used for the measurement of ellipsometric angles of samples at a solid-gas or solid-liquid interface, and achieve phase-shift measurements with precision of ∼0.01°. We demonstrate the technique by measuring the time-dependent refractive index of methanol-water mixtures and thin films at the liquid/fused-silica interface, showing that the monitoring of monolayers on microsecond time scales using EW-CRDE should be achievable.
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