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A novel 3D absorption correction method for quantitative EDX-STEM tomography
Pierre Burdet1, Z Saghi1, A N Filippin2
1Department of Materials Science and Metallurgy, University of Cambridge, Charles Babbage Road 27, Cambridge CB3 0FS, Cambridgeshire, UK.
Ultramicroscopy
|October 21, 2015
Summary
This study introduces a new 3D method to correct X-ray absorption in microanalysis. The technique accurately corrects for absorption artifacts in heterogeneous samples, improving elemental mapping accuracy.
Area of Science:
- Materials Science
- Analytical Chemistry
- Microscopy
Background:
- Energy dispersive X-ray (EDX) microanalysis is crucial for elemental composition determination.
- Absorption of X-rays in heterogeneous samples introduces significant artifacts, complicating accurate quantification.
- Existing methods struggle with unknown sample structures and compositions.
Purpose of the Study:
- To develop and validate a novel 3D method for correcting X-ray absorption in EDX microanalysis.
- To address the challenges posed by heterogeneous samples with unknown structures.
- To improve the accuracy of elemental quantification in complex materials.
Main Methods:
- Utilized scanning transmission electron microscopy (STEM) combined with EDX.
- Employed 3D reconstruction to map X-ray generation sites and paths.
- Implemented a voxel-by-voxel absorption correction based on estimated local composition.
Main Results:
- Demonstrated significant reduction of reconstruction artifacts caused by X-ray absorption.
- Identified and corrected for incomplete oxide recovery and erroneous carbon presence in a core/shell nanowire.
- Validated the method's accuracy using low-absorption X-ray lines.
Conclusions:
- The novel 3D absorption correction method effectively mitigates artifacts in EDX microanalysis.
- This technique enhances the reliability of elemental mapping for heterogeneous samples.
- Accurate quantitative analysis of complex nanostructures is now more achievable.
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