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X-ray absorption, phase and dark-field tomography through a beam tracking approach
Fabio A Vittoria1,2, Marco Endrizzi1, Paul C Diemoz1,2
1Department of Medical Physics and Biomedical Engineering, University College London, Malet Place, Gower Street, WC1E 6BT London, United Kingdom.
Scientific Reports
|November 7, 2015
Summary
This study introduces a novel beam-tracking computed tomography method. It enables 3D mapping of absorption, refraction, and dark-field signals, potentially usable with lab sources.
Area of Science:
- Physics
- Materials Science
- Imaging Technology
Background:
- Computed tomography (CT) typically measures X-ray absorption.
- Advanced CT techniques aim to extract more information, such as refraction and scattering (dark-field).
- Existing methods often require complex setups or highly coherent sources.
Purpose of the Study:
- To develop a versatile computed tomography method using beam-tracking.
- To enable simultaneous retrieval of absorption, refraction, and dark-field signals.
- To reconstruct 3D maps of these properties from experimental data.
Main Methods:
- Implementation of a beam-tracking approach within a computed tomography framework.
- Utilizing an absorbing mask and high-resolution detector to monitor beam intensity variations.
- Employing multi-Gaussian interpolation to decouple absorption, refraction, and dark-field signals.
- Reconstruction of 3D maps using standard filtered back projection.
Main Results:
- Successful demonstration of 3D mapping of absorption, refraction, and dark-field signals.
- The method retrieves the real and imaginary parts of the refractive index and the dark-field signal.
- The technique shows potential for implementation with less coherent laboratory X-ray sources.
Conclusions:
- The developed beam-tracking computed tomography method offers a comprehensive approach to material characterization.
- It provides simultaneous quantitative information on absorption, refraction, and dark-field.
- The low coherence requirement broadens the applicability of this advanced imaging technique beyond synchrotron facilities.
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