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Interband cascade lasers with long lifetimes.

I E Trofimov, C L Canedy, C S Kim

    Applied Optics
    |November 13, 2015
    PubMed
    Summary
    This summary is machine-generated.

    Accelerated aging tests predict a remarkably long operational lifespan for narrow-ridge interband cascade lasers. These semiconductor devices are expected to last decades, even under demanding conditions.

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    Area of Science:

    • Optoelectronics and Semiconductor Devices
    • Laser Technology
    • Materials Science

    Background:

    • Narrow-ridge interband cascade lasers (ICLs) are crucial for various optical applications.
    • Understanding their long-term reliability is essential for deployment in demanding environments.
    • Accelerated aging studies provide insights into device degradation and predict operational lifetimes.

    Purpose of the Study:

    • To evaluate the long-term reliability of narrow-ridge interband cascade lasers through accelerated aging.
    • To statistically model the degradation behavior and predict the operational lifetime.
    • To provide data supporting the use of ICLs in applications requiring extended operational periods.

    Main Methods:

    • Subjecting narrow-ridge interband cascade lasers to accelerated aging at elevated temperatures (90°C) and maximum continuous-wave (CW) power.
    • Statistically analyzing aging curves using log-normal distribution of failure times.
    • Applying mixed-effects models to assess the impact of degradation parameters on device performance.

    Main Results:

    • Analysis of 10,000 hours of output power data revealed unexpectedly long predicted lifetimes.
    • The linear degradation model projected a lifetime of approximately 500,000 hours (57 years).
    • The exponential degradation model predicted a lifetime of around 183,000 hours (21 years).

    Conclusions:

    • Narrow-ridge interband cascade lasers demonstrate exceptional long-term reliability.
    • The predicted operational lifetimes significantly exceed typical requirements for many applications.
    • These findings support the use of ICLs in scenarios demanding high reliability and longevity.