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Measurement of lattice parameter and strain using convergent beam electron diffraction
1Department of Materials Technology, Brunel University of West London, Middlesex, England.
Journal of Electron Microscopy Technique
|September 1, 1989
Summary
This review covers diffraction methods for measuring lattice parameters and strain. Convergent beam electron diffraction (CBED) offers localized measurements, useful for precipitation and recrystallization studies.
Area of Science:
- Materials Science
- Crystallography
- Solid-State Physics
Background:
- Lattice parameters and strain are critical material properties influencing performance.
- Diffraction techniques are standard methods for their measurement.
- Understanding strain distribution is key in materials characterization.
Purpose of the Study:
- To review diffraction-based methods for measuring lattice parameters and strain.
- To highlight the advantages of Convergent Beam Electron Diffraction (CBED) for localized analysis.
- To illustrate CBED applications in materials science.
Main Methods:
- Review of diffraction techniques for lattice parameter and strain determination.
- Focus on the principles and application of Convergent Beam Electron Diffraction (CBED).
- Analysis of diffraction peak broadening due to strain and size effects.
Main Results:
- Strain broadens diffraction maxima, separable from size broadening.
- CBED provides localized lattice parameter and strain data.
- CBED effectively measures misfit in precipitation and strain in recrystallizing microstructures.
Conclusions:
- Diffraction techniques, particularly CBED, are powerful tools for characterizing lattice parameters and strain.
- CBED's localized nature offers unique advantages for microstructural analysis.
- The study illustrates the practical benefits and limitations of applying CBED.