MOS Capacitor
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Angada B Sachid1,2, Mahmut Tosun1,2,3, Sujay B Desai1,2,3
1Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, 94720, USA.
Researchers developed monolithic 3D integrated circuits using transition metal dichalcogenide materials. This breakthrough enables ultralow-voltage and ultralow-power applications with high-density circuit integration.
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