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Updated: Mar 24, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

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SPAD array chips with full frame readout for crystal characterization

Peter Fischer¹, Roberto Blanco¹, Ilaria Sacco¹

¹Heidelberg University, Germany.

|March 10, 2016

Summary

No abstract available in PubMed .

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