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Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Xiaoze Ou1, Guoan Zheng2, Changhuei Yang1
1Department of Electrical Engineering, California Institute of Technology, Pasadena, CA, 91125, USA.
This erratum corrects the resolution calibration of a microscope system. The study now uses line periodicity, not line width, for accurate imaging system performance evaluation.
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