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Updated: Mar 24, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Richard S Gates1, Mark G Reitsma1, John A Kramar1
1National Institute of Standards and Technology, Gaithersburg, MD 20899.
Accurate calibration of atomic force microscope (AFM) cantilevers is crucial for nanoscale mechanical measurements. This study evaluated various calibration methods in a VAMAS round robin, offering guidelines for improved accuracy and reproducibility in AFM cantilever spring constant determination.
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