Bilateral Optical Power Meter Comparison Between NIST and CENAM
I Vayshenker1, X Li1, D J Livigni1
1Optoelectronics Division, National Institute of Standards and Technology, Boulder, CO 80305.
Abstract:
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrología (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wavelengths of 1302 nm and 1546 nm are reported. Both laboratories' reference standards were compared by means of a temperature-controlled optical trap detector. Measurements showed a largest difference of less than 3.4 parts in 10(3), which is within the combined expanded (k = 2) uncertainty for the laboratories' reference standards.
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