Bilateral Optical Power Meter Comparison Between NIST and CENAM

Area of Science:

• Optical Metrology
• National Metrology
• Standards Comparison

Background:

• Accurate optical power measurements are crucial for scientific and industrial applications.
• Interlaboratory comparisons ensure the consistency and traceability of measurement standards.
• National Metrology Institutes (NMIs) like NIST and CENAM maintain primary reference standards.

Purpose of the Study:

• To compare the reference standards for optical power measurements between NIST (USA) and CENAM (Mexico).
• To validate the consistency of measurement capabilities between the two metrology laboratories.
• To report measurement results at specific infrared wavelengths.

Main Methods:

• Utilized a temperature-controlled optical trap detector for precise comparison.
• Performed measurements using both open-beam (free-field) and optical-fiber-based techniques.
• Conducted measurements at two key infrared wavelengths: 1302 nm and 1546 nm.

Main Results:

• The largest difference observed between NIST and CENAM reference standards was less than 3.4 parts in 10^3.
• This observed difference falls within the combined expanded uncertainty (k=2) of the reference standards.
• Demonstrated high agreement between the measurement standards of the two participating NMIs.

Conclusions:

• The reference standards for optical power measurements at NIST and CENAM are in excellent agreement.
• The comparison validates the traceability and reliability of measurements performed by both laboratories.
• Confirms the capability of both institutes to provide accurate and consistent optical metrology services.