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Interlaboratory Comparison of Magnetic Thin Film Measurements
F C S da Silva1, C M Wang1, D P Pappas1
1National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305.
Summary
A study evaluated a potential low magnetic moment standard reference material (SRM). Results indicate specific hysteresis loop properties are crucial for an effective SRM candidate.
Area of Science:
- Materials Science
- Metrology
- Magnetism
Background:
- Accurate characterization of magnetic materials is essential for developing standard reference materials (SRMs).
- Low magnetic moment materials present unique challenges in metrology and standardization.
Purpose of the Study:
- To assess the suitability of a potential low magnetic moment standard reference material (SRM) through an interlaboratory comparison.
- To define key magnetic properties required for a reliable SRM.
Main Methods:
- Hysteresis-loop measurements were performed on nine NiFe film samples by thirteen laboratories.
- Diverse magnetometry techniques were employed, including inductive-field loopers, vibrating-sample magnetometers, alternating-gradient force magnetometers, and superconducting quantum-interference-device magnetometers.
Main Results:
- Saturation moment (m s) measurements were reproduced with less than 5% variation among participating laboratories.
- The study identified critical parameters for an SRM candidate: a square hysteresis loop (m r/m s > 90%), intrinsic coercivity (H c) around 400 A·m⁻¹, and saturation moment (m s) near 2 × 10⁻⁷ A·m².
Conclusions:
- NiFe films on Si substrates demonstrate potential as a low magnetic moment SRM.
- Specific magnetic properties, including loop squareness and coercivity, are vital for SRM candidate selection.
