Interlaboratory Comparison of Magnetic Thin Film Measurements

A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment m s, the remanent moment m r, and the intrinsic coercivity H c of nine samples were extracted from hysteresis-loop measurements. Samples were measured by thirteen laboratories using inductive-field loopers, vibrating-sample magnetometers, alternating-gradient force magnetometers, and superconducting quantum-interference-device magnetometers. NiFe films on Si substrates had saturation moment measurements reproduced within 5 % variation among the laboratories. The results show that a good candidate for an SRM must have a highly square hysteresis loop (m r/m s > 90 %), H c ≈ 400 A·m(-1) (5 Oe), and m s ≈ 2 × 10(-7) A·m(2) (2 × 10(-4) emu).