Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

26.6K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
26.6K
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

5.1K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
5.1K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

5.9K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.9K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Electron ptychography reveals correlated lattice vibrations at atomic resolution.

Nature communications·2026
Same author

Platform and Framework for Time-Resolved Nanoscale Thermal Transport Measurements in STEM.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same author

Quasi-2D Morphologies of a Non-Fullerene Acceptor Y6 by Interfacial Assembly via Langmuir-Schaefer Technique.

Advanced materials (Deerfield Beach, Fla.)·2025
Same author

Nanoindentation for Tailored Single-Photon Emitters in hBN: Influence of Annealing on Defect Stability.

ACS nano·2025
Same author

Approaching one nanosecond temporal resolution with square-wave-based control signals for interference gating.

Ultramicroscopy·2025
Same author

From text to insight: large language models for chemical data extraction.

Chemical Society reviews·2024
Same journal

Erratum: Bacterial Turbulence at Compressible Fluid Interfaces [Phys. Rev. Lett. 136, 138301 (2026)].

Physical review letters·2026
Same journal

Unveiling Light-Quark Yukawa Flavor Structure via Dihadron Fragmentation at Lepton Colliders.

Physical review letters·2026
Same journal

Adaptable Route to Fast Coherent State Transport via Bang-Bang-Bang Protocols.

Physical review letters·2026
Same journal

Topological Transition and Emergence of Elasticity of Dislocation in Skyrmion Lattice: Beyond Kittel's Magnetic-Polar Analogy.

Physical review letters·2026
Same journal

Pound-Drever-Hall Method for Superconducting-Qubit Readout.

Physical review letters·2026
Same journal

Coupling a ^{73}Ge Nuclear Spin to an Electrostatically Defined Quantum Dot in Silicon.

Physical review letters·2026
See all related articles

Related Experiment Video

Updated: Mar 17, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

9.7K

Inversion of Dynamical Scattering from Large-Angle Rocking-Beam Electron Diffraction Patterns.

Feng Wang1, Robert S Pennington1, Christoph T Koch1

  • 1Institut für Physik, Humboldt-Universität zu Berlin, Newtonstraße 15, 12489 Berlin, Germany.

Physical Review Letters
|July 16, 2016
PubMed
Summary
This summary is machine-generated.

This study introduces a new method for determining crystal structure factors from electron diffraction data without needing chemical composition. The technique performs best with wide beam tilt ranges and thin specimens, improving structure retrieval.

More Related Videos

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

15.3K
Synthesis and Microdiffraction at Extreme Pressures and Temperatures
07:26

Synthesis and Microdiffraction at Extreme Pressures and Temperatures

Published on: October 7, 2013

11.8K

Related Experiment Videos

Last Updated: Mar 17, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

9.7K
Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

15.3K
Synthesis and Microdiffraction at Extreme Pressures and Temperatures
07:26

Synthesis and Microdiffraction at Extreme Pressures and Temperatures

Published on: October 7, 2013

11.8K

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Accurate crystal structure determination is crucial for understanding material properties.
  • Electron diffraction is a powerful technique for analyzing crystalline materials.
  • Retrieving structure factors from diffraction data can be challenging due to dynamical scattering effects.

Purpose of the Study:

  • To develop and validate a novel ab initio method for structure factor retrieval.
  • To assess the method's performance using both experimental and simulated large-angle rocking-beam electron diffraction data.
  • To investigate the influence of experimental parameters on the accuracy of structure factor retrieval.

Main Methods:

  • Utilized large-angle rocking-beam electron diffraction.
  • Employed an ab initio approach, requiring no prior information on atomicity or chemical composition.
  • Applied global optimization techniques to invert dynamical scattering, focusing on beam tilt range and specimen thickness.

Main Results:

  • Successfully retrieved structure factors from thin crystal diffraction data.
  • Demonstrated that the method is effective even with moderate multiple scattering.
  • Numerical experiments confirmed that a large beam tilt range is optimal for accurate inversion.
  • Thinner specimens were found to yield better results, minimizing scattering complexities.

Conclusions:

  • The developed ab initio method offers a robust way to determine structure factors from electron diffraction data.
  • Optimizing the beam tilt range and minimizing specimen thickness are key to successful structure factor retrieval using this method.
  • This approach advances the capability of electron diffraction for precise crystallographic analysis without external chemical information.