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Integrated circuit authentication using photon-limited x-ray microscopy.

Adam Markman, Bahram Javidi

|July 16, 2016

Summary

This summary is machine-generated.

This study introduces a new method for authenticating integrated circuits (ICs) using low-energy X-rays. The technique accurately identifies counterfeit ICs, preventing potential damage from high-energy imaging.

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Area of Science:

Electrical Engineering
Materials Science
Computer Science

Background:

Counterfeit integrated circuits (ICs) pose a security risk due to subtle, potentially damaging configuration changes.
Traditional X-ray imaging for IC authentication can cause damage due to high energy requirements.
There is a need for non-destructive authentication methods for ICs.

Purpose of the Study:

To develop and validate a technique for authenticating integrated circuits (ICs) using photon-limited X-ray imaging.
To investigate the feasibility of using low-energy X-rays for counterfeit IC detection.
To prevent potential damage to ICs during the authentication process.

Main Methods:

Modeled low-energy X-ray imaging using a weighted photon-counting method to generate photon-limited images.
Applied the Speeded-Up Robust Features (SURF) algorithm for feature extraction from X-ray images.
Authenticated ICs by comparing extracted SURF features against a database of authentic and counterfeit ICs.

Main Results:

Successfully authenticated ICs using images captured with significantly lower X-ray energy.
Demonstrated high accuracy in distinguishing between authentic and counterfeit ICs.
Validated the effectiveness of the photon-counting imaging model and SURF algorithm in this application.

Conclusions:

The developed technique enables reliable IC authentication under photon-limited, low-energy X-ray conditions.
This approach offers a non-destructive alternative to traditional high-energy X-ray methods.
This work represents a novel application of photon-counting X-ray imaging for IC security.