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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Multiple Negative Differential Resistance Device by Using the Ambipolar Behavior of Tunneling Field Effect Transistor

Jae Won Jeong, E-San Jang, Sunhae Shin

    Journal of Nanoscience and Nanotechnology
    |August 4, 2016
    PubMed

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