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Volume determination of irregularly-shaped quasi-spherical nanoparticles
Ravi Kiran Attota1, Eileen Cherry Liu2
1Engineering Physics Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA. Ravikiran.attota@nist.gov.
Analytical and Bioanalytical Chemistry
|September 24, 2016
Summary
Determining nanoparticle (NP) volume is crucial for applications. This study introduces a faster, more economical method combining top-down projection area and peak height measurements for accurate NP size estimation.
Area of Science:
- Materials Science
- Nanotechnology
- Analytical Chemistry
Background:
- Nanoparticle (NP) size is critical for applications in medicine, engineering, and cosmetics.
- Accurate high-throughput volumetric measurement of irregularly-shaped quasi-spherical NPs remains challenging with single tools.
- Existing methods like electron tomography are time-consuming and costly.
Purpose of the Study:
- To develop a simple, accurate, and high-throughput method for estimating nanoparticle volume.
- To overcome the limitations of single-tool measurements for irregularly-shaped NPs.
- To compare the accuracy of the proposed method against conventional techniques.
Main Methods:
- Combining top-down projection area measurements with peak height data from two different tools.
- Utilizing modeling, simulations, and experimental measurements for validation.
- Analyzing measurement biases inherent in Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM).
Main Results:
- The combined method provides a more accurate volume estimate for quasi-spherical NPs compared to SEM or AFM alone.
- The proposed technique is significantly faster and more economical than electron tomography.
- Identified inherent measurement biases in SEM and AFM, with SEM often yielding larger diameters than AFM.
Conclusions:
- The developed method offers a much-needed high-throughput solution for accurate nanoparticle volumetric measurement.
- This approach enhances the reliability of NP characterization across various scientific and industrial fields.
- Understanding and accounting for SEM/AFM biases is crucial for precise NP size determination.
