Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Semiconductors
Types of Semiconductors
Fermi Level
Fermi Level Dynamics
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
J Z Zhao1,2, W Fan3, M J Verstraete4
1Department of Physics, South University of Science and Technology of China, 518055 Shenzhen, People's Republic of China.
Researchers propose a new Peierls-type system on wurtzite semiconductor surfaces. This system forms one-atom-wide metallic rows that transition to an insulating state below a critical temperature.
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