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EBSD spatial resolution for detecting sigma phase in steels.

S Fernandez Bordín1, S Limandri1, J M Ranalli2

  • 1Instituto de Física Enrique Gaviola, CONICET. M. Allende s/n, Ciudad Universitaria, 5000 Córdoba, Argentina.

Ultramicroscopy
|October 1, 2016
PubMed
Summary
This summary is machine-generated.

Monte Carlo simulations reveal electron backscatter diffraction (EBSD) spatial resolution in steel. Beam size significantly impacts lateral resolution (20nm), with longitudinal (75nm) and depth (16nm) resolutions also determined.

Keywords:
Electron backscatter diffractionMonte Carlo simulationSigma phaseSpatial resolutionStainless steel

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Area of Science:

  • Materials Science
  • Metallurgy
  • Analytical Techniques

Background:

  • Electron Backscatter Diffraction (EBSD) is crucial for microstructural analysis.
  • Understanding EBSD spatial resolution is vital for accurate material characterization.
  • Sigma phase precipitation in steel affects mechanical properties, particularly in nuclear applications.

Purpose of the Study:

  • To investigate the spatial resolution limits of EBSD for sigma phase in steel.
  • To determine the influence of instrumental parameters and simulation methods on EBSD resolution.
  • To assess the capability of EBSD for detecting fine sigma phase precipitates in stainless steel.

Main Methods:

  • Monte Carlo simulations were employed to model the EBSD signal.
  • The active volume for diffracted electrons was estimated using Kikuchi pattern contrast data.
  • Incident beam size and pattern deconvolution software capabilities were factored into the resolution estimation.

Main Results:

  • Lateral spatial resolution was found to be strongly dependent on beam size, achieving 20nm.
  • Longitudinal and depth resolutions were determined to be 75nm and 16nm, respectively.
  • The study confirmed EBSD's ability to detect small sigma phase grains in AISI 347 stainless steel.

Conclusions:

  • EBSD offers high spatial resolution, enabling the characterization of fine microstructural features like sigma phase.
  • The simulation methodology provides a reliable estimation of EBSD spatial resolution.
  • Accurate resolution data is essential for interpreting EBSD results in materials subjected to relevant heat treatments.