Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy

Jin Seob Kim1, Bijan Afsari2, Gregory S Chirikjian1

  • 11 Department of Mechanical Engineering, Johns Hopkins University , Baltimore, Maryland.

Summary

This study introduces a fast method to check if small-angle X-ray scattering (SAXS) and cryo-electron microscopy (EM) data match. This compatibility check ensures structural integrity before detailed 3D reconstruction.