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Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2-3,

John A Dagata1, Alain C Diebold2, C K Ken Shih3

  • 1Precision Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.

Journal of Research of the National Institute of Standards and Technology
|January 1, 1996
PubMed
Abstract

No abstract available in PubMed .

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