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Nondestructive Profilometry of Optical Nanofibers
Lars S Madsen1, Christopher Baker1, Halina Rubinsztein-Dunlop1
1Centre for Engineered Quantum Systems, School of Mathematics and Physics, The University of Queensland , Saint Lucia, Brisbane, Queensland 4072, Australia.
Nano Letters
|December 15, 2016
Summary
We developed a new, non-damaging optical scattering method to image submicrometer optical nanofibers. This technique provides fast, high-precision characterization, crucial for advancing fiber optic technologies.
Area of Science:
- Photonics and Nanotechnology
- Optical Metrology
Background:
- Single-mode optical nanofibers are vital for advanced technologies.
- Current imaging methods for nanofibers are destructive or lack precision.
Purpose of the Study:
- To develop a nondestructive, high-resolution imaging technique for optical nanofibers.
- To enable rapid characterization of submicrometer fiber dimensions.
Main Methods:
- An optical scattering-based scanning method using a probe nanofiber.
- Local scattering of the evanescent field of a sample nanofiber.
- Utilizing standard fiber-puller equipment.
Main Results:
- Achieved subnanometer radial resolution (0.7 nm in 10 ms).
- Demonstrated video-rate imaging of single-mode nanofibers.
- Obtained complete high-precision profiles within minutes.
Conclusions:
- The developed method offers fast, precise, and nondestructive characterization of optical nanofibers.
- Enables improved fabrication quality control for applications like sensors and atom traps.
- Facilitates further research and development in nanofiber-based technologies.
Keywords:
Optical nanofibersevanescent fieldnano profilometrynanophotonicsnear-field imagingsuper-resolution imaging
