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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
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X-ray grating interferometer for in situ and at-wavelength wavefront metrology
Yves Kayser1, Christian David1, Uwe Flechsig1
1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
Journal of Synchrotron Radiation
|December 24, 2016
Summary
A new X-ray grating interferometry setup enables precise, in-situ wavefront metrology for synchrotron and X-ray laser beamlines. This tool assesses optical element quality and X-ray beam characteristics under operational conditions.
Area of Science:
- Optics and Photonics
- Materials Science
- Physics
Background:
- Increasing demands for high-quality X-ray beams necessitate advanced metrology.
- Preserving wavefront shape and coherence is critical for X-ray applications.
- Existing diagnostic instruments require enhanced sensitivity and in-situ capabilities.
Purpose of the Study:
- To report a novel wavefront metrology setup using X-ray grating interferometry.
- To enable quantitative, in-situ, and at-wavelength wavefront measurements.
- To characterize X-ray optical elements and assess beam quality at beamlines.
Main Methods:
- Development of a transportable X-ray grating interferometry setup.
- Implementation at the Swiss Light Source (SLS).
- Detailed description of hardware and data analysis procedures.
Main Results:
- Demonstration of spatially resolved, quantitative wavefront measurements.
- Successful characterization of optical elements under working conditions.
- Exemplary experiments performed at the SLS X05DA Optics beamline.
Conclusions:
- The developed setup is a valuable tool for in-situ investigation of X-ray optical elements.
- It provides crucial insights into the quality of X-ray beams delivered at endstations.
- X-ray grating interferometry is an adequate technique for quantitative wavefront sensing.
