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Updated: Mar 9, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
1s2p resonant inelastic X-ray scattering combined dipole and quadrupole analysis method
Alexander Bagger1, Ties Haarman2, Anna Puig Molina2
1Department of Physics, Technical University of Denmark, DK-2800 Lyngby, Denmark.
Resonant inelastic X-ray scattering (RIXS) offers additional information beyond X-ray absorption spectroscopy (XAS) only when quadrupole excitations are present. This finding helps scientists optimize experimental planning for materials analysis.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Spectroscopy
Background:
- X-ray absorption spectroscopy (XAS) and resonant inelastic X-ray scattering (RIXS) are powerful techniques for material characterization.
- Understanding the complementary information provided by XAS and RIXS is crucial for effective experimental design.
Purpose of the Study:
- To develop an analysis strategy for more effective use of RIXS compared to XAS.
- To determine the specific conditions under which RIXS provides information not obtainable through XAS.
Main Methods:
- Analysis of the RIXS plane using two theoretical models: an exciton model for quadrupole excitations and a continuum model for dipole excitations.
- Application of the developed approach to experimental 1s2p RIXS data from VO2 and TiO2.
Main Results:
- RIXS provides additional information compared to XAS exclusively when quadrupole excitations are present.
- The exciton model effectively describes quadrupole excitations, while the continuum model addresses dipole excitations.
Conclusions:
- RIXS is most valuable when quadrupole excitations are a significant factor in the material's electronic structure.
- Integrating this understanding with XAS dipole contribution calculations enables more efficient experimental planning and data interpretation.
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