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Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping.

Thomas C Pekin1, Christoph Gammer2, Jim Ciston3

  • 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720.

Ultramicroscopy
|February 7, 2017
PubMed
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This summary is machine-generated.

Accurate strain mapping using scanning nanobeam electron diffraction requires precise measurement of diffracted disk positions. Prefiltering diffraction patterns with a Sobel filter or using square-root magnitude weighted phase correlation improves measurement accuracy, especially with complex disk structures.

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Scanning nanobeam electron diffraction (SNED) enables nanoscale strain mapping over large areas by analyzing diffracted disk positions.
  • Accurate measurement of these disk positions is critical for reliable strain calculation.
  • Non-uniform illumination within diffracted disks can introduce measurement errors.

Purpose of the Study:

  • To compare various correlation methods for measuring diffracted disk positions in SNED.
  • To evaluate the susceptibility of these methods to measurement errors caused by non-uniform disk illumination.
  • To identify optimal correlation techniques for accurate strain mapping.

Main Methods:

  • Simulated and experimental diffraction pattern datasets were used for method comparison.
Keywords:
Nanobeam electron diffractionStrain measurement

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  • Correlation techniques were assessed for their robustness against illumination variations.
  • Sobel filter prefiltering and square-root magnitude weighted phase correlation were investigated.

    • Main Results:

    • Prefiltering diffraction patterns with a Sobel filter significantly improved accuracy.
    • Square-root magnitude weighted phase correlation also yielded superior results.
    • Both methods demonstrated enhanced performance when inner disk structure was present.

    Conclusions:

    • The choice of correlation method critically impacts the accuracy of SNED strain mapping.
    • Sobel filtering and weighted phase correlation are recommended for robust strain analysis.
    • These improved methods enhance the reliability of nanoscale strain measurements in materials.