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Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries
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Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of

Andreas Stoffers1, Juri Barthel2, Christian H Liebscher3

  • 11Institute of Physics (IA),RWTH Aachen University,Otto-Blumenthal-Straβe, 52074 Aachen,Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|February 21, 2017
PubMed

Keywords:
atom probe tomographycorrelative microscopygrain boundaryscanning transmission electron microscopysilicon

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