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A simplified digital lock-in amplifier for the scanning grating spectrometer.
Jingru Wang1, Zhihong Wang1, Xufei Ji1
1College of Instrumentation and Electrical Engineering, Jilin University, 130021 Changchun, China.
The Review of Scientific Instruments
|March 3, 2017
Summary
This study introduces a simplified digital lock-in amplifier for scanning grating spectrometers, reducing complexity and computational demands. The novel method achieves a high signal-to-noise ratio, improving spectral measurements.
Area of Science:
- Spectroscopy
- Instrumentation
- Signal Processing
Background:
- Traditional analog lock-in amplifiers for spectrometers involve complex circuitry and debugging.
- Digital lock-in amplifiers require significant computational power and storage.
- Existing methods present challenges in measurement and control systems.
Purpose of the Study:
- To present a simplified digital lock-in amplifier for scanning grating spectrometers.
- To reduce the hardware complexity and computational demands of spectral measurements.
- To improve the signal-to-noise ratio in spectrometer systems.
Main Methods:
- Developed a simplified digital lock-in amplifier using absolute value averaging over a complete period.
- Implemented the system on a low-cost microcontroller without multipliers.
- Utilized two positive zero-crossing detections for phase locking, eliminating the need for a reference signal and specific sampling frequency configurations.
Main Results:
- The simplified digital lock-in amplifier was successfully applied to a scanning grating spectrometer.
- Theoretical signal-to-noise ratio was calculated as 2055.
- Experimental results showed a signal-to-noise ratio of 2403.
Conclusions:
- The simplified digital lock-in amplifier offers a cost-effective and efficient solution for scanning grating spectrometers.
- The method effectively reduces hardware complexity and computational requirements.
- The achieved signal-to-noise ratio demonstrates the viability and effectiveness of the proposed measurement technique.

