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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure.

M Alania1, T Altantzis1, A De Backer1

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

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Summary

Combining depth sectioning and atom-counting in scanning transmission electron microscopy (STEM) allows for 3D reconstruction of nanoparticles. This technique precisely measures atomic column depth, revealing nanoparticle morphology.

Keywords:
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Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Aberration correction in scanning transmission electron microscopy (STEM) enhances lateral and depth resolution.
  • Depth sectioning enables 3D visualization of individual impurity atoms.

Purpose of the Study:

  • Investigate 3D reconstruction of nanosized particles by combining depth sectioning and atom-counting.
  • Precisely measure the depth location of atomic columns for nanoparticle morphology analysis.

Main Methods:

  • Utilized depth sectioning in STEM, recording images at varying defocus values.
  • Employed precise atom-counting techniques.
  • Validated methods with simulations and experimental data of gold nanorods.

Main Results:

  • Demonstrated that while individual atom depth location is not precise, atomic columns' depth can be accurately measured.
  • Successfully reconstructed the 3D morphology of a gold nanorod.

Conclusions:

  • The combination of depth sectioning and atom-counting offers new possibilities for 3D nanoparticle reconstruction.
  • Precise measurement of atomic column depth is key to determining nanoparticle morphology in 3D.