Development of compact Cs corrector for desktop electron microscope

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Wei-Yu Chang1, Fu-Rong Chen1

  • 1Engineering and System Science Department, National Tsing Hua University, Hsinchu 30013, Taiwan ROC.

Ultramicroscopy
|May 2, 2017
PubMed

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