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Spectralon spatial depolarization: towards an intrinsic characterization using a novel phase shift distribution

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    Accurately characterizing spectralon spatial depolarization is crucial for low reflectance samples. This study proposes a new method using polarimetric imaging to determine the degree of polarization (DOP) based on reflectance.

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    Area of Science:

    • Radiometry and Polarimetry
    • Optical Engineering
    • Materials Science

    Background:

    • Spectralons are essential radiometric reference samples with calibrated reflectance.
    • Characterizing the degree of polarization (DOP) of scattered light from low reflectance samples is challenging.
    • Spatial depolarization in spectralons affects radiometric measurements.

    Purpose of the Study:

    • To propose an accurate method for determining the spatial depolarization of spectralons.
    • To establish a relationship between reflectance and the degree of polarization (DOP) of scattered light.
    • To analyze the statistical distribution of polarization states in scattered light.

    Main Methods:

    • Utilizing a spatially resolved polarimetric imaging system to capture pixel-wise polarization states.
    • Performing statistical distribution analysis on the polarization data across the entire image.
    • Analyzing the relative phase shift distribution between orthogonal electric field components.

    Main Results:

    • The relative phase shift distribution shows high sensitivity to sample reflectance, following a circular Voigt profile.
    • The intrinsic spatial depolarization is linked to the circular Cauchy contribution of phase dispersion.
    • An analytic equation was derived to estimate spatially integrated DOP as a function of reflectance.

    Conclusions:

    • The proposed method accurately determines spectralon spatial depolarization, even for low reflectance samples.
    • The study provides a new analytic equation for estimating DOP based on reflectance.
    • This work enhances the understanding and characterization of polarization effects in radiometric measurements.